ÚFI/Výuka/Fyzikální inženýrství a nanotechnologie/1. ročník, II. stupeň/Povrchy a tenké vrstvy I     

Povrchy a tenké vrstvy I

Přednášky z předmětu Povrchy a tenké vrstvy I

• Obsah přednášek je inovován.

Tutorials:

•  Topic 1

•  Topic 2

•  Topic 3

•  Topic 4

•  Topic 5

Reviews of experimental techniques as presented by students during lectures (list is  here)

1.  Photoelectron spectroscopy: XPS and UPS

2.  Scanning probe microscopy and spectroscopy: STM, STS, manipulation

3.  Electron diffraction: LEED, RHEED

4.  Ion scattering: LEIS, MEIS, RBS

5.  Energy loss and vibrational spectroscopy: EELS, FTIR, Raman, (incl. imaging)

6.  Low energy electron microscopy: LEEM

7.  X-ray diffraction and scattering: XRD, XRR, SAXS

8.  Electron microscopy: SEM, SAM (AES)

9.  Scanning probe microscopy and advanced techniques: AFM, KFM, EFM, MFM, SNOM

10.  Mass spectroscopy: SIMS

11.  Electron microscopy: TEM

12.  Optical characterization: UV/Vis, Ellipsometry, Reflectometry

13.  Synchrotron based techniques: PES, XAS, NEXAFS, XMCD, …

Odkazy:

• Surface Science Tutorials

• Semiconductor Devices

• Quantum Mechanics

• Interactive Explanations for Semiconductor Devices

• Nanoscale fabrication